Detwinning-induced reduction in ductility of twinned copper nanowires

Size Effect and Deformation Mechanism in Twinned Copper Nanowires

Molecular dynamics simulations were performed to demonstrate the synergistic effects of the extrinsic size (nanowire length) and intrinsic size (twin boundary spacing) on the failure manner, yield strength, ductility and deformation mechanism of the twinned nanowires containing high density coherent twin boundaries CTBs paralleled to the nanowires’ axis. The twinned nanowires show an intense ex...

Strength Asymmetry of Twinned Copper Nanowires under Tension and Compression

Molecular dynamics simulations reveal the asymmetrical yield strength of twinned copper nanowires under tension and compression. The simulation results show that the strength of nanowires depends on loading conditions, morphologies, and twin spacing. Under tensile loading condition the Schmidt factor of the leading partial is larger than that under compression. Effectively, the yield strength u...

Incoherent structural relaxation of fivefold twinned nanowires

Oxidation-assisted ductility of aluminium nanowires.

Oxidation can drastically change mechanical properties of nanostructures that typically have large surface-to-volume ratios. However, the underlying mechanisms describing the effect oxidation has on the mechanical properties of nanostructures have yet to be characterized. Here we use reactive molecular dynamics and show that the oxidation enhances the aluminium nanowire ductility, and the oxide...

Self-seeded growth of five-fold twinned copper nanowires: mechanistic study, characterization, and SERS applications.

A comprehensive mechanistic study conducted on the formation mechanism of five-fold twinned copper nanowires by heating copper(I) chloride with oleylamine at 170 °C is presented. Electron microscopy and UV-visible absorption spectra are used to analyze the growth mechanism of copper nanowires. High-resolution transmission electron microscopy and selected-area electron diffraction are used to in...